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  ICON STS 8102
 
 
Description
         
 
Multi-Site MOSFET Tester

Target Device:
MOSFET, Multi-Die MOSFET, Diodes Array

Final Test:
Up to 4 sites by 1000v/40A per site, MOSFET test box interface to handler and menu software driven for programming

Wafer Test:
True multi-site/dies testing on MOSFET wafer with Floating source, up to 4 sites by 40v/10A per site, 1000v/per quad site testing; Optional expanding to 8 site, 16 sites. MOSFET Test box interface with prober, menu software driven for programming.
 
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