System-on-Chip (SoC) Test System - AccoTEST

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Shaping Tomorrow’s Technology

Tomorrow’s world is data-driven — a continuous loop of creation, consumption, and optimisation. From streamlining everyday tasks to enabling predictive insights that reduce downtime, data propels industries towards near-perfect performance. In this landscape, the future of semiconductors is inseparable from the future of every industry shaping or reshaping the world.

One Platform for All

The STS8600 is an all-in-one test platform designed to handle both analog and digital parameters, built specifically for high-power and complex multidimensional chips.

Power Testing Solution

Consumer Electronics Application

Application Processor

Mobile PMC

Mobile RF Transceiver

SoC Testing Solution

Internet of Things Application

Mobile RF Transceiver

SoC Testing Solution

Automotive Communication & High Speed Network Application

MCU

BMS

Smart Cockpit & ADAS Enabler

SoC Testing Solution

Server Application

Application
Processor

MCU

Testing Made Simple

Simplify your testing for maximum ROI. Achieve the highest yield with our cutting-edge solutions, backed by our robust R&D team, to meet your complex industrial needs.

Best Use Cases

Solutions

>4000 DIO Channels

>2000A Device Power Supply

800Mbps Data Rate

1.5Gvec Vector Memory

>1000 Analog VI Channels

Symmetrical DUT Interface Design with Large Application Area

All-In-One Digital and Analog Cards Design

Explore Power Test System

STS8200

Analog, Digital to Power Discrete

Industry leading scalable semiconductor test platform for small signal analog, digital hybrid devices to power discrete.

STS8200 PMOS

Analog and Power Discrete

Optimal cost of test system for discrete to power MOSFETs with menu-driven programming, multi-stations capability.

STS8200 AXE-PM

Analog and Power Modules

The preferred discrete to power semiconductor test system for low to high power MOSFETs, IGBTs, SiC, GaN, KGD, PIM, and IPM modules.

STS8200 AXE-FET

Analog Discrete and Wafer Test

The go-to highest parallelism test system for discrete MOSFETs, IGBTs, SiC, GaN to hard-docking wafer test system capability.

STS8200 AXE-PLUS

Analog and Power Modules

Leading high-power semiconductor testing systems capable of testing MOSFETs, IGBTs, SiC, GaN, KGD, PIM, IPM modules, and wafer.

STS8300

Analog PMIC and Mixed-Signal

All-in-one test head resource for multi-parallelism, multi-task open architecture test systems with high-density analog and digital resource channels.

STS8600

System on Chip (SoC)

Engineered for core applications in data centres, automotive and IoT, this system integrates advanced test stimuli and measurement circuitry for FPGA, MCU, and wireless connectivity — all supported by a liquid-cooled, ultra-modern next generation test head.

Find the Right Solution

Make Testing More Valuable

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Copyright © 2026 Beijing Huafeng Test & Control Technology Co., Ltd. All rights reserved. 京ICP备09020255号-3